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Robust multi-angle structured illumination lensless microscopy via illumination angle calibration.

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    This study introduces a robust Multi-angle Structured Illumination Lensless (MASIL) microscopy system. It accurately calibrates illumination angles using a novel double-sided mask, enabling high-resolution imaging without prior angle knowledge.

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    Area of Science:

    • Microscopy
    • Optical Engineering
    • Image Reconstruction

    Background:

    • Multi-angle structured illumination lensless (MASIL) microscopy offers high-resolution, wide-field imaging.
    • Accurate knowledge of illumination angles is critical for MASIL image recovery.
    • System misalignments can lead to image artifacts.

    Purpose of the Study:

    • To develop a MASIL microscopy system robust against illumination misalignment.
    • To introduce a method for calibrating illumination angles without prior knowledge.
    • To enable reliable high-resolution imaging in lensless microscopy systems.

    Main Methods:

    • Designed and utilized a double-sided mask with distinct upper and lower surface patterns (ring-array and disk-array).
    • Developed a calibration technique by estimating the relative displacement of the mask patterns in captured images.
    • Experimentally validated the system's ability to recover images without pre-calibrated illumination angles.

    Main Results:

    • Demonstrated successful image recovery in MASIL microscopy despite illumination misalignment.
    • The double-sided mask method effectively decodes illumination angles from captured images.
    • Achieved artifact-free reconstruction without requiring prior knowledge of illumination parameters.

    Conclusions:

    • The developed MASIL system provides a simple and robust solution for wide-field lensless microscopy.
    • The novel calibration approach addresses LED array misalignment and angle-varied illumination.
    • This method enhances the applicability of MASIL microscopy across various scientific fields.