In situ transient Laue x-ray diffraction during high strain-rate tension

In situ transient synchrotron Laue x-ray diffraction based on high-energy and broadband x rays under high strain-rate tensile loading was developed at a superconducting wiggler beamline at the Beijing Synchrotron Radiation Facility. A split-Hopkinson tensile bar is utilized to realize this dynamic loading condition, while the transient Laue x-ray diffraction captures the transient internal structure of monocrystalline materials. Plastic deformation of a monocrystalline nickel specimen was investigated to prove the ability of this instrumentation in the characterization of a dynamic response of monocrystalline materials during a high strain-rate impact process with 5 µs time resolution.