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The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
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Updated: Sep 26, 2025

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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X-ray Diffraction Imaging of Deformations in Thin Films and Nano-Objects.

Olivier Thomas1, Stéphane Labat1, Thomas Cornelius1

  • 1Aix Marseille Univ, CNRS, IM2NP UMR 7334, Campus de St-Jérôme, 13397 Marseille, France.

Nanomaterials (Basel, Switzerland)
|April 23, 2022
PubMed
Summary

Advanced X-ray imaging techniques now offer high-resolution mapping of crystal strains and defects. Innovations in optics, detectors, and synchrotron sources are driving progress in materials science.

Keywords:
X-ray diffractionmappingnanostructuresstrain

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Area of Science:

  • Materials Science
  • Crystallography
  • Physics

Background:

  • Accurate quantification and localization of elastic strains and defects in crystals are crucial for material function prediction and control.
  • X-ray imaging techniques have significantly advanced, enabling detailed analysis of material properties at micro and nano scales.

Purpose of the Study:

  • To provide a progress report on the rapid evolution of X-ray imaging for strain and defect analysis in materials.
  • To highlight recent advancements in X-ray optics, detectors, and synchrotron radiation sources impacting materials characterization.

Main Methods:

  • X-ray diffraction mapping utilizing advanced optical elements for nanoscale resolution (50-100 nm).
  • Lensless imaging techniques achieving even higher resolutions (5-10 nm).
  • Development of new two-dimensional hybrid pixel detectors with enhanced dynamics, speed, and low noise.
  • Implementation of new accelerator ring concepts (hybrid multi-bend achromat lattice) for increased synchrotron brilliance and coherent flux.

Main Results:

  • Significant progress in X-ray imaging resolution, reaching the 5-10 nm range with lensless techniques.
  • Revolutionized measurement strategies due to advanced detector capabilities.
  • Substantial increase (100x) in synchrotron radiation brilliance and coherent flux from new accelerator designs.

Conclusions:

  • The field of X-ray imaging for strain and defect analysis is rapidly advancing.
  • Future developments will likely focus on 3D imaging methods capable of *in situ* observation of material evolution under stress or during transitions.
  • Managing large datasets generated by these advanced techniques will be a significant challenge.