Olivier Thomas

11PUBLICATIONS
34CO-AUTHORS
Compound semiconductorsNanoscale characterisationCondensed matter imagingCrystallographyMetals and alloy materials
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Publications (11)

|Aug 07, 2025
Correlated X-Ray and Electron Microscopies of a Single Biphasic GaAs Nanowire.

Thomas Dursap, Tao Zhou, Maxime Dupraz

|Aug 06, 2025
Three-point bending behavior of individual ZnO nanowires studied by in situ Laue microdiffraction.

Soufiane Saïdi, Michael Texier, Shruti Sharma

|Feb 13, 2023
Kinematic scattering by nanocrystals.

Olivier Thomas, Ismail Cevdet Noyan

|Sep 23, 2022
In Situ Nano-Indentation of a Gold Sub-Micrometric Particle Imaged by Multi-Wavelength Bragg Coherent X-ray Diffraction.

Florian Lauraux, Stéphane Labat, Marie-Ingrid Richard

|May 31, 2022
Imaging the facet surface strain state of supported multi-faceted Pt nanoparticles during reaction.

Maxime Dupraz, Ni Li, Jérôme Carnis

|Apr 23, 2022
X-ray Diffraction Imaging of Deformations in Thin Films and Nano-Objects.

Olivier Thomas, Stéphane Labat, Thomas Cornelius

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