Jove
Visualize
Contact Us

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Stratum corneum nanotexture feature detection using deep learning and spatial analysis: a noninvasive tool for skin barrier assessment.

GigaScience·2024
Same author

3D-Printed Radiopaque Microdevices with Enhanced Mucoadhesive Geometry for Oral Drug Delivery.

Advanced healthcare materials·2022
Same author

Real-Time Reflectance Measurement Using an Astigmatic Optical Profilometer.

Sensors (Basel, Switzerland)·2022
Same author

Correction to Hacking CD/DVD/Blu-ray for Biosensing.

ACS sensors·2022
Same author

In-Silico Selection of Aptamer Targeting SARS-CoV-2 Spike Protein.

International journal of molecular sciences·2022
Same author

Quantifying Optical Absorption of Single Plasmonic Nanoparticles and Nanoparticle Dimers Using Microstring Resonators.

ACS sensors·2020
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Video

Updated: Sep 26, 2025

Electrospray Deposition of Uniform Thickness Ge23Sb7S70 and As40S60 Chalcogenide Glass Films
08:38

Electrospray Deposition of Uniform Thickness Ge23Sb7S70 and As40S60 Chalcogenide Glass Films

Published on: August 19, 2016

8.7K

Method for Film Thickness Mapping with an Astigmatic Optical Profilometer.

Hsien-Shun Liao1, Shih-Han Cheng1, En-Te Hwu2

  • 1Department of Mechanical Engineering, National Taiwan University, Taipei 10617, Taiwan.

Sensors (Basel, Switzerland)
|April 23, 2022
PubMed
Summary

This study introduces a new method using astigmatic optical profilometry to measure transparent thin film thickness. The technique accurately captures subsurface information, overcoming previous limitations for films as thin as 18 micrometers.

Keywords:
astigmatismoptical profilometerthickness measurement

More Related Videos

Thin Film Composite Silicon Elastomers for Cell Culture and Skin Applications: Manufacturing and Characterization
08:02

Thin Film Composite Silicon Elastomers for Cell Culture and Skin Applications: Manufacturing and Characterization

Published on: July 3, 2018

10.8K
Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
11:47

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

15.7K

Related Experiment Videos

Last Updated: Sep 26, 2025

Electrospray Deposition of Uniform Thickness Ge23Sb7S70 and As40S60 Chalcogenide Glass Films
08:38

Electrospray Deposition of Uniform Thickness Ge23Sb7S70 and As40S60 Chalcogenide Glass Films

Published on: August 19, 2016

8.7K
Thin Film Composite Silicon Elastomers for Cell Culture and Skin Applications: Manufacturing and Characterization
08:02

Thin Film Composite Silicon Elastomers for Cell Culture and Skin Applications: Manufacturing and Characterization

Published on: July 3, 2018

10.8K
Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
11:47

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

15.7K

Area of Science:

  • Optical engineering
  • Materials science
  • Metrology

Background:

  • Astigmatic optical profilometers are advanced tools for surface analysis, offering high resolution and bandwidth.
  • Current applications are limited to surface morphology, neglecting potential for subsurface analysis.
  • Transparent thin film thickness measurement is crucial in various industries.

Purpose of the Study:

  • To develop and validate a novel method for measuring transparent thin film thickness using astigmatic optical profilometry.
  • To extend the capabilities of astigmatic optical profilometers beyond surface morphology.
  • To address challenges in measuring thin films and demonstrate 3D imaging of both surfaces.

Main Methods:

  • Development of a modified astigmatic optical profilometer setup.
  • Implementation of a decoupling method to overcome coupling issues for thinner films.
  • Experimental validation using transparent films of varying thicknesses.

Main Results:

  • Accurate measurement of transparent thin film thickness, with demonstrated capability for films tens of micrometers thick.
  • Successful measurement of an 18-μm-thick film using the devised decoupling method.
  • Demonstration of 3D imaging, capturing both upper and lower surfaces of the films.

Conclusions:

  • Astigmatic optical profilometry can be effectively utilized for precise transparent thin film thickness measurements.
  • The developed method expands the application scope of astigmatic optical profilometers to subsurface analysis.
  • This technique offers a cost-effective and high-resolution solution for thin film characterization.