A New Optical Configuration for the Surface Encoder with an Expanded Z-Directional Measuring Range.

Yifan Hong1, Ryo Sato1, Yuki Shimizu2

  • 1Precision Nanometrology Laboratory, Department of Finemechanics, Tohoku University, Sendai 980-8579, Japan.

Summary

This study introduces a novel optical configuration for a two-axis surface encoder, enabling precise measurement of both in-plane (X-axis) and out-of-plane (Z-axis) displacements. Experiments confirm its feasibility, achieving a Z-directional measuring range of ±1.5 mm.

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