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Updated: Sep 25, 2025

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Abstract:
A double interferometer technique is presented. One interferometer generates a reference scale, while the other one is used as a measuring tool. The presented apparatus makes it possible to overcome 2π ambiguity by monitoring the phase difference at short time or space intervals. The phase unwrapping procedure is very simple due to a homodyne reference scale time interval method. The accuracy of the method is of 1 nm. The drift of the laser power and unequal gain of the photodetectors do not affect the system performance. The precision of the technique can be improved significantly by using a high-resolution time interval analyzer. The application of the method for determining the profile of a curved surface is demonstrated.
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