Fourier-method beam analysis for coherent vertical cavity surface emitting laser arrays

Area of Science:

• Optics and Photonics
• Semiconductor Lasers
• Coherent Array Characterization

Background:

• Vertical cavity surface emitting laser (VCSEL) arrays are essential for advanced optical systems.
• Characterizing optical coupling and coherence in VCSEL arrays is critical for their performance.
• Existing methods for coherence analysis can be time-consuming.

Purpose of the Study:

• To introduce a novel, rapid Fourier analysis method for characterizing VCSEL arrays.
• To provide an alternative to traditional beam visibility analysis.
• To enable fast and quantitative assessment of array coherence and supermode properties.

Main Methods:

• Utilizing Fourier analysis on measured beam profiles of VCSEL arrays.
• Developing algorithms to extract supermode characteristics from beam data.
• Comparing the proposed method with existing beam visibility analysis techniques.

Main Results:

• The Fourier method successfully extracts the mode suppression ratio and inter-supermode phase.
• Quantitative determination of array coherence is achieved rapidly.
• The proposed method offers a significant speed advantage over prior techniques.

Conclusions:

• The Fourier analysis method provides an efficient and accurate approach for characterizing VCSEL array coherence.
• This technique facilitates the engineering and exploitation of coherently coupled VCSEL arrays.
• Fast characterization is key to advancing VCSEL array technology.