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Updated: Sep 25, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
Development of a pulsed, variable-energy positron beam for atomic scale defect studies.
A C L Jones1, R G Greaves2, C L Codding3
1Department of Physics and Astronomy, Bowling Green State University, Bowling Green, Ohio 43402, USA.
Positron annihilation spectroscopy now features a new magnetically guided, variable energy beam for detailed materials defect analysis. This advanced technique offers unprecedented depth-dependent characterization of solids, thin films, and irradiated materials.
Area of Science:
- Materials Science
- Atomic Physics
- Solid-State Physics
Background:
- Positron annihilation spectroscopy (PAS) is a highly sensitive, non-destructive technique for material characterization.
- PAS can detect single atom vacancies in solids with high sensitivity (10-7).
Purpose of the Study:
- To develop a magnetically guided, variable energy, pulsed positron beam for depth-dependent defect studies.
- To establish the first such facility in the United States for advanced materials analysis.
Main Methods:
- Development of a magnetically guided, variable energy, pulsed positron beam.
- Design of a target stage for in situ annealing up to 800°C.
- Implementation of a novel method to reduce background from backscattered positrons.
Main Results:
- Successful development of a versatile positron beam for materials characterization.
- The system allows for in situ annealing studies and background noise reduction.
- The beam enables depth-dependent defect profiling in various materials.
Conclusions:
- The new positron beam facility is a powerful tool for characterizing thin films, devices, and ion-irradiated materials.
- This advancement significantly enhances the capabilities for defect analysis in the US.
- The system provides sensitive, non-destructive insights into material properties at the atomic level.
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