Novel fabrication technique for high-resolution spherical crystal analyzers using a microporous aluminium base

Area of Science:

• Spectroscopy
• Materials Science
• X-ray Physics

Background:

• Modern inelastic X-ray spectrometers require precisely curved analyzers for high-resolution measurements.
• Fabricating these analyzers is costly, time-consuming, and often unreliable.

Purpose of the Study:

• To introduce a novel, cost-effective fabrication technique for high-resolution X-ray analyzers.
• To improve the quality and reusability of X-ray spectrometer components.

Main Methods:

• Utilized a concave-spherical, microporous aluminum base and a glass substrate with a diced crystal wafer.
• Applied uniform vacuum forces to draw the glass substrate into the base, achieving the desired curvature.
• Diced the crystal layer to prevent strain on individual pixels during bending.

Main Results:

• Successfully fabricated Si(844) and Ge(337) analyzers with overall energy resolutions of 29.4 meV and 56.6 meV, respectively.
• Analyzers demonstrated performance equal or superior to traditional counterparts in resonant inelastic X-ray scattering (RIXS) measurements.
• The technique significantly decreased process and material costs and allowed for lens and crystal reusability.

Conclusions:

• The novel fabrication technique offers a more efficient and economical approach to producing high-quality X-ray analyzers.
• This method enhances the reliability and reusability of critical spectrometer components.
• The developed analyzers are suitable for demanding RIXS applications requiring high energy resolution.