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Updated: Sep 24, 2025

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
Zahra Mazaheri1, Can Koral1,2, Antonello Andreone3,4
1Department of Physics "E. Pancini", University of Naples "Federico II", 80126, Naples, Italy.
We developed a new terahertz time-domain spectroscopic ellipsometer (THz-TDSE) with an advanced calibration method for precise material characterization. This technique accurately analyzes materials, even those with high absorption rates, using THz-TDSE.
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