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A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics
Published on: August 28, 2018
Mott variable-range hopping transport in a MoS2 nanoflake
Jianhong Xue1, Shaoyun Huang1, Ji-Yin Wang1
1Beijing Key Laboratory of Quantum Devices, Key Laboratory for the Physics and Chemistry of Nanodevices, Department of Electronics, Peking University Beijing 100871 China hqxu@pku.edu.cn syhuang@pku.edu.cn.
Abstract:
The transport characteristics of a disordered, multilayered MoS2 nanoflake in the insulator regime are studied by electrical and magnetotransport measurements. The MoS2 nanoflake is exfoliated from a bulk MoS2 crystal and the conductance G and magnetoresistance are measured in a four-probe setup over a wide range of temperatures. At high temperatures, we observe that ln G exhibits a -T -1 temperature dependence and the transport in the nanoflake dominantly arises from thermal activation. At low temperatures, where the transport in the nanoflake dominantly takes place via variable-range hopping (VRH) processes, we observe that ln G exhibits a -T -1/3 temperature dependence, an evidence for the two-dimensional (2D) Mott VRH transport. Furthermore, we observe that the measured low-field magnetoresistance of the nanoflake in the insulator regime exhibits a quadratic magnetic field dependence ∼ αB 2 with α ∼ T -1, fully consistent with the 2D Mott VRH transport in the nanoflake.
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