Effect of nanostructured silicon on surface enhanced Raman scattering

Gang Lu1, Guilin Wang1, Hai Li1

  • 1Key Laboratory of Flexible Electronics (KLOFE), & Institute of Advanced Materials (IAM), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM), Nanjing Tech University (NanjingTech) 30 South Puzhu Road Nanjing 211816 China iamhli@njteh.edu.cn.

RSC Advances
|May 11, 2022
PubMed
Summary

Silicon morphology significantly impacts Surface-Enhanced Raman Spectroscopy (SERS) enhancement. Understanding this relationship in metal-nonmetal composites is key to developing more efficient SERS systems.