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A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics
Published on: August 28, 2018
Tunnable rectifying performance of in-plane metal-semiconductor junctions based on passivated zigzag phosphorene
ShaoLong Su1, Jian Gong1, Zhi-Qiang Fan2
1School of Physical Science and Technology, Inner Mongolia University Hohhot 010021 People's Republic of China ndgong@imu.edu.cn.
Abstract:
Using first principles density functional theory, we perform a systematic study of the band structures of passivated zigzag phosphorene nanoribbons (ZPNRs) and the transport properties of in-plane metal-semiconductor junctions. It is found that the ZPNR passivated by H, Cl or F atoms is a semiconductor, and the ZPNR passivated by C, O or S atoms is a metal. Therefore, ZPNRs with different passivated atoms can be fabricated into an in-plane metal-semiconductor junction. The calculated current-voltage characteristics indicate that these in-plane metal-semiconductor junctions can exhibit excellent rectification behavior. More importantly, we find that the type of passivated atom plays a very important role in the rectification ratio of this in-plane metal-semiconductor junction. The findings are very useful for the further design of functional nanodevices based on ZPNRs.
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