Characterization of Polymer Brush Membranes via HF Etch Liftoff Technique

Surface modification using end-tethered polymer brushes is an attractive, versatile, and effective method of tailoring the surface properties of a material. However, because the chains are covalently attached, characterization of these films is limited. When polymer brushes are detached in their native state, as opposed to fabricating a cross-linked initiator support, additional analytical techniques can be employed. We report lifting off patterned polymer brush membranes from a silicon oxide surface via a hydrofluoric acid etch. This method allows examination of polymer brushes via TEM and thus provides information regarding the perfection of initiator self-assembled monolayer formation and brush growth, as well as the effect of different cross-linking procedures.