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Noise logic with an InGaN/SiNx/Si uniband diode photodetector
Jiaxun Song1, Richard Nötzel2,3
1Guangdong Provincial Key Laboratory of Optical Information Materials and Technology, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou, 510006, People's Republic of China. jiaxunsong@m.scnu.edu.cn.
Abstract:
Noise logic is introduced by the wavelength dependent photocurrent noise of an InGaN/SiNx/Si uniband diode photodetector. A wavelength versus photocurrent noise discrimination map is constructed from the larger photocurrent noise for red light than that for green light. A minimum measurement time of four seconds is deduced from the standard deviation of the photocurrent noise for a safe wavelength distinction. A logic NOT gate is realized as representative with on or off red or green light as binary 1 or 0 inputs and the photocurrent noise above or below a defined threshold as binary 1 or 0 outputs.
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