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Updated: Sep 22, 2025

Characterizing DNA Repair Processes at Transient and Long-lasting Double-strand DNA Breaks by Immunofluorescence Microscopy
Published on: June 8, 2018
Low-Energy (5-20 eV) Electron-Induced Single and Double Strand Breaks in Well-Defined DNA Sequences
1Institute of Chemistry - Hybrid Nanostructures, University of Potsdam, Karl-Liebknecht-Straße 24-25, 14476 Potsdam, Germany.
Abstract:
Ionizing radiation is used in cancer radiation therapy to effectively damage the DNA of tumors. The main damage is due to generation of highly reactive secondary species such as low-energy electrons (LEEs). The accurate quantification of DNA radiation damage of well-defined DNA target sequences in terms of absolute cross sections for LEE-induced DNA strand breaks is possible by the DNA origami technique; however, to date, it is possible only for DNA single strands. In the present work DNA double strand breaks in the DNA sequence 5'-d(CAC)4/5'-d(GTG)4 are compared with DNA single strand breaks in the oligonucleotides 5'-d(CAC)4 and 5'-d(GTG)4 upon irradiation with LEEs in the energy range from 5 to 20 eV. A maximum of strand break cross section was found around 7 and 10 eV independent of the DNA sequence, indicating that dissociative electron attachment is the underlying mechanism of strand breakage and confirming previous studies using plasmid DNA.
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