Super-resolution Fluorescence Microscopy
Electron Microscope Tomography and Single-particle Reconstruction
Scanning Electron Microscopy
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Updated: Sep 21, 2025

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
Published on: July 27, 2018
Wyatt A Curtis1,2, Simon A Willis1,2, David J Flannigan1,2
1Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Avenue SE, Minneapolis, MN 55455, USA. flan0076@umn.edu.
Understanding photoelectron trajectories in ultrafast electron microscopy (UEM) is key to improving collection efficiency (CE). This study reveals how laser parameters and gun elements significantly impact CE in single-electron regimes for femtosecond 4D UEM.
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