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Updated: Sep 21, 2025

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Contrast Mechanisms in Secondary Electron e-Beam-Induced Current (SEEBIC) Imaging.

Ondrej Dyck1, Jacob L Swett2,3, Charalambos Evangeli3

  • 1Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|June 1, 2022
PubMed
Summary

Secondary electron e-beam-induced current (SEEBIC) imaging in STEM visualizes sample conductivity. This technique offers a new method for characterizing electrical properties in nanomaterials like graphene nanoribbons.

Keywords:
SEEBICgraphene nanodeviceresistive contrast imagingscanning transmission electron microscopysecondary electron e-beam-induced current

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