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Post-acquisition mask misalignment correction for edge illumination x-ray phase contrast imaging.
D Shoukroun1, A Doherty1, M Endrizzi1
1Department of Medical Physics and Biomedical Engineering, University College London, London WC1E 6BT, United Kingdom.
The Review of Scientific Instruments
|June 1, 2022
Summary
A new method corrects gradient artifacts in edge illumination x-ray phase contrast imaging caused by mask movement. This technique preserves image quality and enables accurate porosity quantification in materials like carbon fiber composites.
Area of Science:
- Materials Science
- Imaging Technology
- Physics
Background:
- Edge illumination x-ray phase contrast imaging (EIXPCI) translates phase effects into intensity variations using apertured masks.
- Mask movement during EIXPCI acquisition can introduce gradient artifacts, compromising image quality.
- Accurate material characterization relies on artifact-free imaging data.
Purpose of the Study:
- To develop and validate a post-acquisition method for correcting gradient artifacts in EIXPCI.
- To assess the impact of the correction method on image quality and quantitative analysis.
- To demonstrate the effectiveness of the correction on a carbon fiber composite sample.
Main Methods:
- Developed a post-acquisition image processing technique to quantify mask misalignment.
- Implemented correction maps derived from misalignment data to remove gradient artifacts.
- Applied the correction method to EIXPCI of a woven carbon fiber composite plate with porosity.
Main Results:
- The developed method successfully quantified post-acquisition mask misalignment.
- Gradient artifacts were effectively removed from the EIXPCI data.
- Image quality was maintained, and quantitative porosity measurements were unaffected by the correction process.
Conclusions:
- The developed method provides a robust solution for correcting gradient artifacts in EIXPCI.
- This artifact correction is crucial for reliable quantitative analysis in materials science.
- The technique enhances the utility of EIXPCI for defect detection and material characterization.
