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Updated: Jul 13, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
Meron Tesfaye1,2, Douglas I Kushner2, Bryan D McCloskey1,2
1Chemical and Biomolecular Engineering, University of California-Berkeley, Berkeley, California 94720, United States.
Thin perfluorosulfonated ion-conducting polymer (PFSI) films show thickness-dependent thermal transitions. Reduced thickness increases the thermal transition temperature (TT) in PFSI-H+ but not PFSI-M+, impacting polymer mobility and device function.
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