Coexistence of Contact Electrification and Dynamic p-n Junction Modulation Effects in Triboelectrification

Haobin Wang1,2, Shuyi Huang3, Haoze Kuang1,2

  • 1Key Laboratory of Micro-nano Electronic Devices and Smart Systems of Zhejiang Province, College of Information Science & Electronic Engineering, Zhejiang University, Hangzhou 310027, China.

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