Research on Calculation Method of Radiation Response Eigenvalue of a Single-Chip Active Pixel Sensor

Area of Science:

• Radiation detection and measurement
• Semiconductor device physics
• Image processing

Background:

• Monolithic Active Pixel Sensors (MAPS) are sensitive to radiation.
• Characterizing radiation dose rates using MAPS requires robust analysis methods.
• Existing methods may struggle with complex image backgrounds or low signal-to-noise ratios.

Purpose of the Study:

• To develop and validate a calculation method for radiation response eigenvalues using MAPS.
• To establish a dose rate characterization method based on MAPS signal analysis.
• To assess the performance of different algorithms and image processing techniques for radiation detection.

Main Methods:

• Statistical eigenvalue analysis of MAPS pixel arrays in varying light conditions.
• Comparison of different algorithms for eigenvalue extraction.
• Development of a dose rate characterization method using MAPS response signals.
• Image processing techniques including binarization and frame accumulation.

Main Results:

• A linear relationship was observed between statistical eigenvalues and radiation dose rate in dark environments (gray values 10-30).
• Color image backgrounds can interfere with radiation signal detection, causing signal loss.
• Frame accumulation is necessary for low dose rates due to weak signals and noise.
• Binarization and total gray value statistics effectively characterize radiation dose rates across a wide range.

Conclusions:

• The proposed eigenvalue-based method enables wide-range radiation dose rate detection using MAPS.
• Binarization processing is a key technique for effective characterization, especially at low dose rates.
• MAPS technology, with appropriate signal processing, offers a viable solution for radiation monitoring.