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Updated: Sep 5, 2025

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Zhongping Wang1, Sheng Wei1, Danfeng Jiang1
1Department of Physics, Nanchang University, Nanchang 330031, China.
Researchers controlled single silver atom diffusion in silicon for advanced electronics. This breakthrough enables the creation of atomic-scale electronic components and devices, paving the way for miniaturization.
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