Computed Tomography
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Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
Published on: April 13, 2016
Sergey Borisenko1,2, Alexander Fedorov3,4, Andrii Kuibarov3
1Leibniz Institute for Solid State and Materials Research, IFW Dresden, D-01171, Dresden, Germany. S.Borisenko@ifw-dresden.de.
Researchers developed a simpler method for high-resolution 3D Fermi surface mapping using angle-resolved photoemission spectroscopy (ARPES). This breakthrough provides the first detailed experimental 3D Fermi surface datasets, advancing materials science.
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