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Updated: Sep 3, 2025

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Electron Microscopy Probing Electron-Photon Interactions in SiC Nanowires with Ultrawide Energy and Momentum Match
Jinlong Du1, Jin-Hui Chen2,3, Yuehui Li1,4
1Electron Microscopy Laboratory, School of Physics, Peking University, Beijing100871, China.
Abstract:
Light-matter interactions are commonly probed by optical spectroscopy, which, however, has some fundamental limitations such as diffraction-limited spatial resolution, tiny momentum transfer, and noncontinuous excitation/detection. In this work, through the use of scanning transmission electron microscopy-electron energy loss spectroscopy (STEM-EELS) with ultrawide energy and momentum match and subnanometer spatial resolution, the longitudinal Fabry-Perot (FP) resonating modes and the transverse whispering-gallery modes (WGMs) in individual SiC nanowires are simultaneously excited and detected, which span from near-infrared (∼1.2 μm) to ultraviolet (∼0.2 μm) spectral regime, and the momentum transfer can range up to 108 cm-1. The size effects on the resonant spectra of nanowires are also revealed. This work provides an alternative technique to optical resonating spectroscopy and light-matter interactions in dielectric nanostructures, which is promising for modulating free electrons via photonic structures.
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