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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Charles El Helou1, Benjamin Grossmann2, Christopher E Tabor2
1Department of Mechanical Engineering, The Pennsylvania State University, University Park, PA, USA.
Researchers created soft, conductive mechanical materials capable of performing complex computations. This breakthrough enables scalable information processing in engineered matter, advancing autonomous systems.
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