Ultrahigh-dynamic-range wavefront sensor based on absolute double-slit interferometry

This Letter reports a new, to the best of our knowledge, technique for the quality testing of steep optical samples by introducing an absolute interferometry method based on a double-slit interference experiment. We determine the quality of the sample with an ultrahigh-dynamic-range wavefront sensor by determining the deformation of the central fringe of the double-slit interferometer recorded for two different separations of the slits. The transmission function of the double slit is implemented on an amplitude spatial light modulator. Therefore, the slits' location can be easily displaced over the entire area of the sample's wavefront. We applied the proposed method on two samples: a microscope slide and a conventional ophthalmic lens, and maximum absolute phase variations of 0.33 and 26.7 rad were measured, respectively. Our estimation shows that an absolute phase variation of about 700 rad can be measured with this method.