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Erratum: "Modeling the temporal evolution and stability of thin evaporating films for wafer surface processing" [J. Chem. Phys. 157, 084706 (2022)].

The Journal of chemical physics·2024
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Modeling the temporal evolution and stability of thin evaporating films for wafer surface processing.

Max Huber1, Xiao Hu1, Andreas Zienert1

  • 1Fraunhofer Institute for Electronic Nano Systems ENAS, Technologie-Campus 3, 09126 Chemnitz, Germany.

The Journal of Chemical Physics
|September 1, 2022
PubMed
Summary

This study models water evaporation on lithium tantalate (LTO) using ab initio density functional theory (DFT). It develops a method to calculate disjoining pressure parameters from adsorption energies for better fluid film interaction predictions.

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Area of Science:

  • Materials Science
  • Surface Science
  • Computational Chemistry

Background:

  • Understanding fluid-solid interactions is crucial for thin film applications.
  • Lithium tantalate (LTO) is a material with diverse electronic and optical properties.
  • Accurate modeling of water adsorption and evaporation on LTO is needed.

Purpose of the Study:

  • To investigate the interaction of thin evaporating water films with LiTaO3 (LTO).
  • To develop a method for calculating disjoining pressure parameters using ab initio DFT.
  • To model the temporal evolution of water layers during evaporation and spin drying.

Main Methods:

  • Ab initio density functional theory (DFT) for computing adsorption energies.
  • Calculation of Gibbs free energy of adsorption for water on LTO.
  • Integration of disjoining pressure (molecular and structural components) with film thickness.
  • Fitting disjoining pressure integral to DFT-derived Gibbs free energy.
  • Modeling temporal evolution using spin drying and evaporation models.
  • Diffusion and mass balance for water vapor above the film.

Main Results:

  • Adsorption energies and Gibbs free energy of adsorption for water on LTO were computed.
  • A method to determine disjoining pressure parameters from ab initio calculations was established.
  • Temporal evolution of water layers was modeled using established evaporation and spin drying techniques.
  • An analytical approximation for thick films was derived, independent of substrate properties.

Conclusions:

  • The study provides a robust method for parameterizing disjoining pressure models using DFT.
  • The findings enhance the understanding of water-thin film interactions on LTO.
  • The derived approximation simplifies modeling for specific initial water layer conditions.