DFT-1/2 method applied to 3D topological insulators

Tulio Mota1, Filipe Matusalem2, Marcelo Marques1

  • 1Grupo de Materiais Semicondutores e Nanotecnologia, Instituto Tecnológico de Aeronáutica, DCTA, 12228-900 São José dos Campos, Brazil.

Summary

The DFT-1/2 method accurately calculates topological properties of 3D topological insulators like Bi2Se3. This efficient approach improves band gap and band structure predictions without increasing computational cost.

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