The intra-individual reproducibility of flash-evoked potentials in a sample of children

Visual evoked potentials (VEPs) to flash stimuli were recorded twice from 26 children aged 10-13 years, with an intersession interval of about 10 months. Test-retest reliability was poor for recordings taken from scalp locations overlying non-specific cortex and somewhat better for specific cortex. The size of consistency coefficients (i.e. correlations within session) showed that noise and artefacts were not the decisive factors which lower reliability. A comparison with retest correlations of broad band parameters of the EEG at rest for the same sample showed, to our surprise, smaller retest reliability for VEP parameters. Variability of the VEP in children over time seems to be a substantial as its well-known inter-individual variability.