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A Comparative Study of Mid-Crestal Incision and Diode Laser Shaped Incision to Assess Papilla Level in Second Stage
Anuj Singh Parihar1, Abhigyan Manas2, P V Gopinath3
1Department of Periodontics, Peoples Dental Academy, Bhopal, Madhya Pradesh, India.
Objectives:
To assess papilla level using different techniques in a second stage dental implant surgery.
Materials And Methods:
Thirty patients who received 45 dental implants were equally divided into 3 groups of 10 each. Group I patients were operated with a scalpel with mid-crestal incision. In group II, dental implants were exposed with a gallium-aluminum-arsenide diode laser. In group III, dental implants were exposed with I shaped incision using a scalpel. Assessment of modified gingival index (mGI), modified plaque index (mPI), and Jemt index were performed at baseline, 3 months, and 6 months. The measurement of FAJI, FAJAdj, ST height, and CP Bone crest was performed.
Results:
A significant difference in crestal bone level of FAJ- I, FAJ- adj, ST height, and CP Bone crest was recorded at baseline, 3 months, and 6 months among groups I, II, and III (P < 0.05). At 6 months, both groups II and III exhibited >60% of papilla fill as compared to group I.
Conclusion:
Diode laser offers maximum papillary fill and resulted in less crestal bone loss as compared to mid-crestal and I shaped incision during a second stage surgery.
