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Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM
Annelies De Wael1,2, Annick De Backer1,2, Chu-Ping Yu1,2
1EMAT, University of Antwerp, Antwerp, Belgium.
This study introduces methods to visualize atom counting uncertainty from scanning transmission electron microscopy (STEM) images. These approaches improve the statistical analysis of atomic-scale measurements in materials science.
Area of Science:
- Materials Science
- Nanotechnology
- Analytical Chemistry
Background:
- A statistical method for atom counting from annular dark-field scanning transmission electron microscopy (ADF STEM) images was developed a decade ago.
- This method has been validated for its accuracy and precision across various nanocrystal types.
Purpose of the Study:
- To address the lack of uncertainty visualization in existing atom counting methods.
- To present and evaluate novel approaches for representing statistical errors in ADF STEM-based atom counts.
Main Methods:
- Development of three distinct methods for visualizing statistical errors associated with atom counting.
- Utilizing simulations and an experimental ADF STEM image for validation and comparison.
- Comparative analysis to determine the most suitable visualization approach.
Main Results:
- Successful implementation of three methods to visualize atom counting uncertainty.
- Demonstration of the effectiveness of these methods using both simulated and real experimental data.
- Identification of the most appropriate method for future applications.
Conclusions:
- The presented methods effectively visualize the statistical uncertainty in atom counting from ADF STEM images.
- The evaluation provides guidance on selecting the optimal visualization technique for reliable atomic-scale analysis.
- This work enhances the interpretability and trustworthiness of quantitative ADF STEM data.
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