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Updated: Aug 28, 2025

Picometer-Precision Atomic Position Tracking through Electron Microscopy
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Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM

Annelies De Wael1,2, Annick De Backer1,2, Chu-Ping Yu1,2

  • 1EMAT, University of Antwerp, Antwerp, Belgium.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|September 19, 2022
PubMed

Keywords:
model averagingquantitative electron microscopyscanning transmission electron microscopystatistical parameter estimation theorystatistical uncertainty

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