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P-N junction01:11

P-N junction

634
A p-n junction is formed when p-type and n-type semiconductor materials are joined together. At the interface of the p-n junction, holes from the p-side and electrons from the n-side begin to diffuse into the opposite sides due to the concentration gradient. This diffusion of carriers leads to a region around the junction where there are no free charge carriers, known as the depletion region. The charge density within the depletion region for the n-side and p-side can be described by the...
634
Biasing of P-N Junction01:16

Biasing of P-N Junction

780
The operation of a p-n junction diode involves various biasing conditions, including forward bias, reverse bias, and equilibrium.
In equilibrium, no external voltage is applied across the p-n junction. The depletion region is formed at the junction interface due to the diffusion of carriers, which leaves behind charged dopants, acceptors on the p-side, and donors on the n-side. These immobile charges create an electric field that prevents further diffusion of carriers. The related energy band...
780
Metal-Semiconductor Junctions01:24

Metal-Semiconductor Junctions

449
The contact of metal and semiconductor can lead to the formation of a junction with either Schottky or Ohmic behavior.
Schottky Barriers
Schottky barriers arise when a metal with a work function (Φm) contacts a semiconductor with a different work function (Φs). Initially, electrons transfer until the Fermi levels of the metal and semiconductor align at equilibrium. For instance, if Φm > Φs, the semiconductor Fermi level is higher than the metal's before contact. The...
449
Biasing of Metal-Semiconductor Junctions01:27

Biasing of Metal-Semiconductor Junctions

322
Biasing metal-semiconductor junctions involves applying a voltage across the junction. Specifically, the metal is connected to a voltage source, while the semiconductor is grounded. This technique is essential for controlling the direction and magnitude of current flow in electronic devices, including diodes, transistors, and photovoltaic cells.
In Schottky junctions, where the semiconductor is n-type, applying a positive voltage to the metal relative to the semiconductor reduces its Fermi...
322
Carrier Transport01:21

Carrier Transport

535
The generation of electrical current in semiconductors is fundamentally driven by two mechanisms: drift and diffusion. These processes are essential for the functionality and performance of semiconductor-based devices.
Drift Current:
The drift of charge carriers is started by an external electric field (E). Charged particles, such as electrons and holes, experience an acceleration between collisions with lattice atoms. For electrons, this results in a drift velocity (vd) given by:
535
Carrier Generation and Recombination01:22

Carrier Generation and Recombination

755
Carrier generation is the process by which electron-hole pairs (EHPs) are created within the semiconductor. In direct-bandgap semiconductors, such as gallium arsenide (GaAs), this occurs efficiently when energy absorption prompts valence electrons to leap into the conduction band, leaving behind holes.
This process is given by the generation rate G and is efficient due to the conservation of momentum between the valence band maximum and conduction band minimum.
Indirect generation involves an...
755

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Related Experiment Video

Updated: Aug 28, 2025

Scalable Quantum Integrated Circuits on Superconducting Two-Dimensional Electron Gas Platform
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2D pn junctions driven out-of-equilibrium.

Ferney A Chaves1, Pedro C Feijoo1, David Jiménez1

  • 1Departament d'Enginyeria Electrònica, Escola d'Enginyeria, Universitat Autònoma de Barcelona Campus UAB 08193 Bellaterra Spain ferneyalveiro.chaves@uab.cat.

Nanoscale Advances
|September 22, 2022
PubMed
Summary
This summary is machine-generated.

We developed a simulator to understand 2D pn junctions, proposing a new equation for their current-voltage behavior and analyzing their performance for RF applications. This research explores 2D materials for future electronics.

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Area of Science:

  • Condensed Matter Physics
  • Materials Science
  • Electrical Engineering

Background:

  • Two-dimensional (2D) pn junctions are crucial for modern electronics and optoelectronics.
  • Existing research lacks fundamental understanding of 2D pn junction properties, especially out-of-equilibrium.
  • There's a need to bridge the gap between experimental observations and theoretical understanding of 2D pn junctions.

Purpose of the Study:

  • To investigate the electrostatics and electronic transport of 2D lateral pn junctions.
  • To develop a physics-based simulator for analyzing 2D pn junction behavior.
  • To propose a theoretical framework for understanding their current-voltage characteristics and performance.

Main Methods:

  • Implemented a physics-based simulator solving coupled 2D Poisson, drift-diffusion, and continuity equations.
  • Accounted for out-of-plane electric field effects and weak charge carrier screening.
  • Defined an effective depletion layer (EDL) to model junction behavior.

Main Results:

  • Proposed a Shockley-like equation for ideal 2D pn junction current-voltage (J-V) characteristics.
  • Identified recombination-generation processes within the EDL causing deviations from ideal behavior.
  • Analyzed capacitances, conductance, and cut-off frequencies for RF applications, benchmarking 2D MoS2 against 3D Si.

Conclusions:

  • The developed simulator provides fundamental insights into 2D pn junction electrostatics and transport.
  • The proposed model accurately describes J-V characteristics, including deviations due to recombination-generation.
  • This work facilitates the exploration of 2D materials for advanced electronic and RF applications.