The Duality of Ray-Based and Pinhole-Camera Modeling and 3D Measurement Improvements Using the Ray-Based Model

Christian Bräuer-Burchardt1, Roland Ramm1, Peter Kühmstedt1

  • 1Department Imaging and Sensing, Fraunhofer Institute for Applied Optics and Precision Engineering IOF, Albert-Einstein-Str. 7, D-07745 Jena, Germany.