Robust ptychographic X-ray speckle tracking with multilayer Laue lenses

Area of Science:

• Physics
• Optics
• Materials Science

Background:

• X-ray speckle tracking is a powerful technique for wavefront metrology and sample imaging.
• These techniques are compatible with both synchrotron and laboratory X-ray sources.
• Existing methods face challenges with highly divergent wavefields and low-brilliance beams.

Purpose of the Study:

• To present a new implementation of the ptychographic X-ray speckle tracking method.
• To adapt the technique for metrology of highly divergent wavefields, such as those from multilayer Laue lenses.
• To enable robust and quick wavefield measurements and data evaluation for low-brilliance X-ray beams.

Main Methods:

• Development of a novel ptychographic X-ray speckle tracking algorithm.
• Integration of machine learning techniques, including Huber and non-parametric regression.
• Implementation of a high-performance software suite in Python 3 with a C back-end.

Main Results:

• The new method enables robust and quick wavefield measurements and data evaluation.
• Successful imaging of low-contrast samples is achieved.
• The technique is suitable for highly divergent wavefields and low-brilliance X-ray sources.

Conclusions:

• The enhanced X-ray speckle tracking method offers significant improvements for wavefront metrology.
• The integration of machine learning enhances data analysis for X-ray imaging.
• The developed software is accessible and provides high performance for advanced X-ray applications.