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Updated: Aug 25, 2025

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
Marc Botifoll1, Ivan Pinto-Huguet1, Jordi Arbiol1,2
1Catalan Institute of Nanoscience and Nanotechnology (ICN2), CSIC and BIST, Campus UAB, Bellaterra, 08193 Barcelona, Catalonia, Spain. arbiol@icrea.cat.
Machine learning and artificial intelligence (AI) are revolutionizing electron microscopy by automating workflows and enabling new discoveries. This review guides researchers in applying AI tools to materials and nano-sciences.
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