Ultra-high resolution particle size measurement based on scattering spectrum analysis-simulation and experiment

Area of Science:

• Optics
• Spectroscopy
• Nanotechnology

Background:

• Light scattering spectra provide information about particle properties.
• Accurate particle size measurement is crucial in various scientific and industrial fields.
• Existing methods may face limitations in resolution and measurement range.

Purpose of the Study:

• To investigate the properties of light scattering spectra from spherical particles.
• To develop an ultra-resolution particle dimension measurement method.
• To analyze the influence of particle size and scattering angle on scattering spectra.

Main Methods:

• Simulation and investigation of light scattering spectra from spherical particles.
• Development of a particle dimension measurement method based on spectral peak detection.
• Implementation of an accurate spectral peak location strategy to minimize errors.
• Utilizing different scattering angles for small and large particle size measurements.

Main Results:

• The proposed method achieves ultra-high resolution for particle size measurement.
• Particle size resolution of 1.1 nm and 8.3 nm achieved for particles sized 0.25–1 µm and 1–10 µm, respectively, with a 0.8 nm spectral resolution spectrometer.
• Expected picometer-level resolution with a picometer-resolution spectrometer.
• Demonstrated ability to measure smaller particles with high sensitivity and larger particles with a wide range.

Conclusions:

• The developed method offers an effective approach for ultra-resolution particle size measurement.
• The strategy of using specific scattering angles enhances measurement sensitivity and range.
• This technique holds potential for advanced applications requiring precise particle characterization.