A comparison of deep-learning-based inpainting techniques for experimental X-ray scattering

Tanny Chavez1, Eric J Roberts2,3, Petrus H Zwart2,3,4

  • 1Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

Journal of Applied Crystallography
|October 17, 2022
PubMed
Summary

Deep learning image inpainting effectively reconstructs missing X-ray scattering data. Tunable U-Net and mixed-scale dense networks show superior performance over traditional methods.