Three-dimensional measurement method based on a three-step phase-shifting fringe and a binary fringe

Area of Science:

• * Optical metrology and 3D imaging.
• * Computer vision and computational imaging.

Background:

• * Structured light 3D measurement is crucial for complex surface analysis.
• * Existing Gray-code methods offer accuracy but suffer from slow, complex fringe pattern generation.
• * Time-consuming measurements limit the applicability of current 3D scanning techniques.

Purpose of the Study:

• * To develop a faster, accurate 3D measurement technique for complex surfaces.
• * To reduce the complexity and time associated with fringe pattern generation in 3D scanning.
• * To maintain high measurement precision while enhancing speed.

Main Methods:

• * A novel 3D measurement method combining three-step phase-shifting with a single binary fringe pattern.
• * Utilizing a binary fringe pattern with the same period as the phase-shifting patterns.
• * Applying the three-step phase-shifting algorithm for wrapped phase retrieval and connected region labeling for fringe order calculation.

Main Results:

• * The proposed method achieves high-precision 3D measurement comparable to Gray-code techniques.
• * Experimental validation confirms the efficiency and robustness of the new approach.
• * The method demonstrates potential for significantly higher measurement speeds due to simplified fringe patterns.

Conclusions:

• * The proposed three-step phase-shifting with a binary fringe offers a viable alternative for fast and accurate 3D surface measurement.
• * This technique effectively addresses the speed limitations of traditional Gray-code methods.
• * The simplified pattern requirement makes it suitable for applications demanding rapid 3D data acquisition.