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Lens-free Video Microscopy for the Dynamic and Quantitative Analysis of Adherent Cell Culture

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Simulating dark-field X-ray microscopy images with wavefront propagation techniques.

Mads Carlsen¹, Carsten Detlefs², Can Yildirim²

¹Department of Physics, Technical University of Denmark (DTU), Fysikvej, Building 311, 2800 Kgs Lyngby, Denmark.

Acta Crystallographica. Section A, Foundations and Advances

|November 1, 2022

Summary

Dark-field X-ray microscopy images bulk defects in crystals. Numerical simulations accurately reproduced experimental data from a diamond crystal with a stacking fault.

Keywords:

diffraction imaging dynamical diffraction simulation

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Area of Science:

Materials Science
Crystallography
Synchrotron Radiation

Background:

Dark-field X-ray microscopy is a powerful diffraction-based technique for non-destructively imaging defects within crystalline materials.
Understanding defect formation and behavior is crucial for optimizing material properties.

Purpose of the Study:

To develop and validate numerical simulations for image formation in dark-field X-ray microscopy.
To accurately model the imaging of bulk defects in crystalline samples.

Main Methods:

Numerical integration of the dynamical Takagi-Taupin equations.
Wavefront propagation simulations.
Comparison of simulated images with experimental data from a diamond crystal.

Main Results:

The numerical simulations successfully reproduced experimental images of a stacking fault defect.
The approach validates the use of simulations for understanding image formation in this technique.
Demonstrated capability for imaging defects in the bulk of extended crystalline samples.

Conclusions:

Numerical simulations provide a reliable method for interpreting dark-field X-ray microscopy images.
This validated simulation approach can be used to study various defects in crystalline materials.