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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
B F Kraus1, Lan Gao1, K W Hill1
1Princeton Plasma Physics Laboratory, Princeton, New Jersey 08540, USA.
This study developed a new method for measuring hot, solid-density plasmas using an x-ray spectrometer and streak camera. The technique allows for rapid, time-resolved spectral analysis crucial for high-energy-density plasma research.
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