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Updated: Aug 22, 2025

The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors
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Effects of Source/Drain Electrodes on the Performance of InSnO Thin-Film Transistors

Qi Li1, Dedong Han1, Junchen Dong2

  • 1School of Integrated Circuit, Peking University, Beijing 100871, China.

Micromachines
|November 11, 2022
PubMed

Keywords:
InSnO (ITO)bias stress stabilitycontact resistancesource/drain electrodesthin-film transistors (TFTs)

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