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Accurate signal sampling and reconstruction are crucial in various signal-processing applications. A time-domain signal's spectrum can be revealed using its Fourier transform. When this signal is sampled at a specific frequency, it results in multiple scaled replicas of the original spectrum in the frequency domain. The spacing of these replicas is determined by the sampling frequency.
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High-Precision ADC Spectrum Testing under Non-Coherent Sampling Conditions.

Xiaofei Peng1, Jie Li1, Debiao Zhang2

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Summary
This summary is machine-generated.

This study introduces a novel algorithm for accurate analog-to-digital converter (ADC) testing without requiring coherent sampling. The method reconstructs data to eliminate spectral leakage, enabling precise ADC parameter evaluation under relaxed conditions.

Keywords:
four-parameter sine fittinghigh-precision ADCnon-coherent samplingparameter estimationspectral leakage

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Area of Science:

  • Electrical Engineering
  • Signal Processing
  • Measurement Science

Background:

  • Coherent sampling is crucial for high-precision analog-to-digital converter (ADC) spectrum testing.
  • Non-adherence to coherent sampling in spectrum analysis leads to spectral leakage and inaccurate test results.

Purpose of the Study:

  • To develop a robust algorithm for accurate ADC testing that circumvents the need for coherent sampling.
  • To eliminate spectral leakage and improve the precision of spectrum analysis in ADC testing.

Main Methods:

  • A combined four-parameter sine-curve-fitting algorithm was developed for non-coherent sampling.
  • The algorithm fits amplitude, initial phase, and frequency parameters of a sine wave.
  • Reconstruction of test data by calculating and replacing with a coherent sine wave.

Main Results:

  • Simulations confirmed the algorithm's functionality and robustness.
  • The algorithm successfully processed and analyzed measured data from commercial high-precision ADCs.
  • Accurate ADC parameter testing was achieved under relaxed test conditions.

Conclusions:

  • The proposed algorithm effectively eliminates the requirement for coherent sampling in ADC testing.
  • The method demonstrates superiority and effectiveness for precise ADC parameter evaluation.
  • This scheme offers a more flexible and accurate approach to spectrum testing for high-precision ADCs.