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Updated: Aug 22, 2025

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
This study introduces a novel 3D measurement technique for precise nanoscale displacement detection. The method accurately measures X, Y, and Z movements of a 2D grating using dual-channel Littrow incidence.
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