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Updated: Aug 21, 2025

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

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Published on: April 13, 2016

3D scattering microphantom sample to assess quantitative accuracy in tomographic phase microscopy techniques.

Wojciech Krauze¹, Arkadiusz Kuś², Michał Ziemczonok²

¹Institute of Micromechanics and Photonics, Warsaw University of Technology, Boboli 8 street, Warsaw, 02-525, Poland. wojciech.krauze@pw.edu.pl.

Scientific Reports

|November 15, 2022

Summary

This summary is machine-generated.

This study benchmarks computational imaging systems using a biomimetic scattering phantom. Wavelength-dependent scattering impacts tomographic phase microscopy (TPM) reconstruction, showing weak-scattering methods can outperform multiple-scattering ones in the near-infrared.

Failed At:

2026-06-19T13:48:58.747181+00:00

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