Updated: Jun 19, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Sibi Chakravarthy Shanmugavel1, Shwetadwip Chowdhury1
1Department of Electrical and Computer Engineering, University of Texas at Austin.
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
This study presents an adaptive angle-calibration framework for mask-less on-chip phase imaging. It enables wide field-of-view phase imaging by correcting for varying illumination angles from LED arrays.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: