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Current advances on Talbot-Lau x-ray imaging diagnostics for high energy density experiments (invited)
M P Valdivia1, G Perez-Callejo2, V Bouffetier3
1Center for Energy Research, University of California San Diego, La Jolla, California 92093, USA.
The Review of Scientific Instruments
|December 3, 2022
Summary
Talbot-Lau x-ray deflectometry (TXD) was enhanced with monochromatic X-rays for high energy density experiments. Advanced postprocessing tools improved plasma characterization accuracy, achieving sub-6 μm spatial resolution.
Area of Science:
- Plasma physics
- X-ray diagnostics
- High energy density physics
Background:
- Talbot-Lau x-ray interferometry is a phase-contrast diagnostic for electron density gradients.
- Talbot-Lau x-ray deflectometry (TXD) is utilized in high energy density experiments.
Purpose of the Study:
- To enhance monochromatic TXD performance on the Multi-Tera Watt (MTW) laser.
- To improve spatial resolution and Moiré fringe contrast.
- To develop advanced data postprocessing for plasma characterization.
Main Methods:
- Implemented a monochromatic TXD using 8 keV multilayer mirrors.
- Irradiated copper foil and wire targets at 10^14-10^15 W/cm^2.
- Developed the Talbot Interferometry Analysis (TIA) code for data postprocessing.
Main Results:
- Achieved <6 μm spatial resolution with foil targets irradiated at 80°.
- Retrieved phase, attenuation, and dark-field maps of an ablating x-pinch load.
- Measured ~20% attenuation for the dense core and ~10% for low-density material at 8 keV.
Conclusions:
- Enhanced postprocessing via TIA significantly advances TXD capabilities for laser and pulsed power experiments.
- Monochromatic TXD shows promise for accurate plasma characterization.
- Results inform future diagnostic upgrades for improved accuracy.
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