Cycloidal-spiral sampling for three-modal x-ray CT flyscans with two-dimensional phase sensitivity.
G Lioliou1, O Roche I Morgó2, S Marathe3
1Department of Medical Physics and Biomedical Engineering, University College London, Malet Place, London, WC1E 6BT, UK. g.lioliou@ucl.ac.uk.
Scientific Reports
|December 9, 2022
Summary
We developed a faster X-Ray Computed Tomography (CT) method using a cycloidal-spiral trajectory for continuous scanning. This approach reduces scan times for multi-modal imaging while maintaining high image quality and isotropic resolution.
Area of Science:
- Physics
- Materials Science
- Medical Imaging
Background:
- Traditional X-Ray Computed Tomography (CT) methods require sample stepping, increasing scan times.
- Multi-modal X-Ray CT with 2D phase sensitivity offers complementary contrast channels but faces acquisition challenges.
- Step-and-shoot implementations in CT are limited by motor overheads and prolonged scanning durations.
Purpose of the Study:
- To introduce a flyscan-compatible acquisition scheme for three-modal X-Ray CT.
- To enable simultaneous measurement of attenuation, phase, and scattering properties from a single frame.
- To reduce total scan time without compromising image quality or isotropic resolution.
Main Methods:
- A novel acquisition scheme integrating continuous horizontal and vertical sample translations with rotation, creating a "cycloidal-spiral" trajectory.
- Demonstration using a "beam tracking" setup for simultaneous data acquisition.
- Implementation of continuous scanning (flyscans) instead of traditional step-and-shoot methods.
Main Results:
- The proposed scheme is fully compatible with continuous flyscan acquisition.
- Greatly reduced scan times were achieved compared to step-and-shoot methods.
- High image quality and isotropic resolution were largely preserved.
Conclusions:
- The cycloidal-spiral trajectory enables efficient, high-quality multi-modal X-Ray CT.
- This method significantly accelerates the acquisition process for phase-sensitive X-Ray CT.
- The approach offers a promising advancement for applications requiring rapid, detailed sample characterization.
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