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Related Concept Videos

MOS Capacitor01:25

MOS Capacitor

908
A Metal-Oxide-Semiconductor (MOS) capacitor is a fundamental structure used extensively in semiconductor device technology, particularly in the fabrication of integrated circuits and MOSFETs (metal-oxide-semiconductor field-effect transistors). The MOS capacitor consists of three layers: a metal gate, a dielectric oxide, and a semiconductor substrate.
The metal gate is typically made from highly conductive materials such as aluminum or polysilicon. Beneath the metal gate lies a thin layer of...
908

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Large-Scale MoS2 Pixel Array for Imaging Sensor.

Kang Liu1, Xinyu Wang1, Hesheng Su1

  • 1State Key Laboratory of ASIC and System, School of Microelectronics, Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai 200433, China.

Nanomaterials (Basel, Switzerland)
|December 11, 2022
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Summary
This summary is machine-generated.

This study presents a 12x12 pixel image sensor using wafer-scale molybdenum disulfide (MoS2) grown by chemical vapor deposition (CVD). The device achieves high photoresponsivity, demonstrating potential for large-scale optoelectronic applications.

Keywords:
molybdenum disulfide (MoS2)photo sensortwo-dimensional (2D) semiconductors

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Optoelectronics

Background:

  • Two-dimensional molybdenum disulfide (MoS2) is crucial for optoelectronic devices.
  • Mechanical exfoliation yields micro-scale MoS2, limiting industrial scalability.
  • Wafer-scale MoS2 growth is advancing, but uniform large-area devices remain scarce.

Purpose of the Study:

  • To develop a large-scale, uniform MoS2-based image sensor.
  • To demonstrate the potential of chemical vapor deposition (CVD) grown MoS2 for pixel arrays.
  • To achieve high photoresponsivity exceeding traditional CMOS sensors.

Main Methods:

  • Fabrication of a 12x12 pixel array image sensor on a 2 cm x 2 cm monolayer MoS2 film.
  • Growth of MoS2 film using chemical vapor deposition (CVD).
  • Characterization of photoelectric properties and uniformity across the array.

Main Results:

  • Achieved a high photoresponsivity of 364 AW^-1 due to the photogating effect from trap states.
  • Demonstrated highly uniform photoelectric properties across the 12x12 pixel array.
  • Successfully captured concatenated images, validating the sensor's imaging capability.

Conclusions:

  • Wafer-scale CVD-grown MoS2 is suitable for fabricating uniform, large-area optoelectronic devices.
  • The developed MoS2 image sensor exhibits superior photoresponsivity compared to conventional CMOS sensors.
  • This work highlights the significant potential of 2D MoS2 for future optoelectrical applications and imaging systems.